82 search results - page 1 / 17 » Functional Testing of Microprocessors with Graded Fault Cove... |
ATS
2000
IEEE
13 years 9 months ago
2000
IEEE
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
Functional validation of modern microprocessors is an important and complex problem. One of the problems in functional validation is the generation of test cases that has higher p...
GLVLSI
2007
IEEE
13 years 11 months ago
2007
IEEE
The path-delay fault simulation of functional tests on complex circuits such as current processor-based systems is a daunting task. The amount of computing power and memory needed...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
Functional verification of microprocessors is one of the most complex and expensive tasks in the current system-on-chip design process. A significant bottleneck in the validatio...
VLSID
2007
IEEE
14 years 5 months ago
2007
IEEE
We introduce a novel method of test generation for microprocessors at the RTL using spectral methods. Test vectors are generated for RTL faults, which are the stuck-at faults on i...