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» Future Challenges for MEMS Failure Analysis
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ITC
2003
IEEE
183views Hardware» more  ITC 2003»
13 years 10 months ago
Future Challenges for MEMS Failure Analysis
MEMS processes and components are rapidly changing in device design, processing, and, most importantly, application. This paper will discuss the future challenges faced by the MEM...
Jeremy A. Walraven
SC
2009
ACM
14 years 10 days ago
Leveraging 3D PCRAM technologies to reduce checkpoint overhead for future exascale systems
The scalability of future massively parallel processing (MPP) systems is being severely challenged by high failure rates. Current hard disk drive (HDD) checkpointing results in ov...
Xiangyu Dong, Naveen Muralimanohar, Norman P. Joup...
ISSRE
2002
IEEE
13 years 10 months ago
Fault Contribution Trees for Product Families
Software Fault Tree Analysis (SFTA) provides a structured way to reason about the safety or reliability of a software system. As such, SFTA is widely used in missioncritical appli...
Dingding Lu, Robyn R. Lutz
CCR
2004
151views more  CCR 2004»
13 years 5 months ago
Practical verification techniques for wide-area routing
Protocol and system designers use verification techniques to analyze a system's correctness properties. Network operators need verification techniques to ensure the "cor...
Nick Feamster
ICDE
2005
IEEE
164views Database» more  ICDE 2005»
14 years 6 months ago
Knowledge Discovery from Transportation Network Data
Transportation and Logistics are a major sector of the economy, however data analysis in this domain has remained largely in the province of optimization. The potential of data mi...
Wei Jiang, Jaideep Vaidya, Zahir Balaporia, Chris ...