18 search results - page 1 / 4 » GATTO: An Intelligent Tool for Automatic Test Pattern Genera... |
ICTAI
1994
IEEE
13 years 8 months ago
1994
IEEE
CP
1998
Springer
13 years 9 months ago
1998
Springer
In a faulty digital circuit, many (single) faulty gates may explain the observed findings. In this paper we are mostly concerned, not in obtaining alternative diagnoses, but rathe...
DAC
1996
ACM
13 years 9 months ago
1996
ACM
The development of new Field-Programmed, MaskProgrammed and Laser-Programmed Gate Array architectures is hampered by the lack of realistic test circuits that exercise both the arc...
DATE
2004
IEEE
13 years 9 months ago
2004
IEEE
This paper presents 3LSSD, a novel, easilyautomatable approach for scan insertion and ATPG of asynchronous circuits. 3LSSD inserts scan latches only into global circuit feedback p...
EVOW
2001
Springer
13 years 9 months ago
2001
Springer
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...