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IOLTS
2003
IEEE
133views Hardware» more  IOLTS 2003»
13 years 10 months ago
Power Consumption of Fault Tolerant Codes: the Active Elements
On-chip global interconnections in very deep submicron technology (VDSM) ICs are becoming more sensitive and prone to errors caused by power supply noise, crosstalk noise, delay v...
Daniele Rossi, Steven V. E. S. van Dijk, Richard P...
GLVLSI
2000
IEEE
145views VLSI» more  GLVLSI 2000»
13 years 10 months ago
CMOS system-on-a-chip voltage scaling beyond 50nm
† The limits on CMOS energy dissipation imposed by subthreshold leakage currents and by wiring capacitance are investigated for CMOS generations beyond 50nm at NTRS projected loc...
Azeez J. Bhavnagarwala, Blanca Austin, Ashok Kapoo...
VLSID
2006
IEEE
150views VLSI» more  VLSID 2006»
14 years 5 months ago
A Comprehensive SoC Design Methodology for Nanometer Design Challenges
SoC design methodologies are under constant revision due to adoption of fast shrinking process technologies at nanometer levels. Nanometer process geometries exhibit new complex d...
R. Raghavendra Kumar, Ricky Bedi, Ramadas Rajagopa...
ISQED
2009
IEEE
133views Hardware» more  ISQED 2009»
14 years 10 days ago
A novel ACO-based pattern generation for peak power estimation in VLSI circuits
Estimation of maximal power consumption is an essential task in VLSI circuit realizations since power value significantly affects the reliability of the circuits. The key issue o...
Yi-Ling Liu, Chun-Yao Wang, Yung-Chih Chen, Ya-Hsi...