38 search results - page 2 / 8 » Generation of Synthetic Sequential Benchmark Circuits |
ICCAD
2000
IEEE
13 years 10 months ago
2000
IEEE
This paper presents new test generation techniques for improving the average-case performance of the iterative logic array based deterministic sequential circuit test generation a...
DATE
1999
IEEE
13 years 9 months ago
1999
IEEE
A novel approach to testing sequential circuits that uses multi-level decision diagram representations is introduced. The proposed algorithm consists of a combination of scanning ...
ISLPED
1997
ACM
13 years 9 months ago
1997
ACM
A new statistical technique for average power estimation in sequential circuits is presented. Due to the feedback mechanism, conventional statistical procedures cannot be applied ...
TSMC
2010
13 years 4 days ago
2010
Abstract--It is critical to use automated generators for synthetic models and data, given the sparsity of benchmark models for empirical analysis and the cost of generating models ...
AAAI
2008
13 years 7 months ago
2008
Automated generators for synthetic models and data can play a crucial role in designing new algorithms/modelframeworks, given the sparsity of benchmark models for empirical analys...