22 search results - page 2 / 5 » Generation of Test Patterns for Differential Diagnosis of Di... |
ICCAD
1994
IEEE
13 years 9 months ago
1994
IEEE
Existing built-in self test (BIST) strategies require the use of specialized test pattern generation hardware which introduces signi cant area overhead and performance degradation...
CONSTRAINTS
2007
13 years 5 months ago
2007
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
DATE
2006
IEEE
13 years 11 months ago
2006
IEEE
In this paper, we propose a new circuit transformation technique in conjunction with the use of a special diagnostic test pattern, named SO-SLAT pattern, to achieve higher multipl...
ATS
2009
IEEE
14 years 4 days ago
2009
IEEE
Diagnostic ATPG has traditionally been used to generate test patterns that distinguish pairs of modeled faults. In this work, we investigate the use of n-distinguishing test sets,...
FDTC
2010
Springer
13 years 3 months ago
2010
Springer
The testability of the cryptographic cores brings in an extra dimension to the process of digital circuits testing