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DFT
2006
IEEE
125views VLSI» more  DFT 2006»
13 years 11 months ago
Synthesis of Efficient Linear Test Pattern Generators
This paper presents a procedure for Synthesis of LINear test pattern Generators called SLING. SLING can synthesize linear test pattern generators that satisfy constraints on area,...
Avijit Dutta, Nur A. Touba
ITC
1997
IEEE
73views Hardware» more  ITC 1997»
13 years 9 months ago
A Low-Overhead Design for Testability and Test Generation Technique for Core-Based Systems
In a fundamental paradigm shift in system design, entire systems are being built on a single chip, using multiple embedded cores. Though the newest system design methodology has s...
Indradeep Ghosh, Niraj K. Jha, Sujit Dey
ICCD
2006
IEEE
127views Hardware» more  ICCD 2006»
14 years 1 months ago
Power Droop Testing
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
Ilia Polian, Alejandro Czutro, Sandip Kundu, Bernd...
BMCBI
2006
172views more  BMCBI 2006»
13 years 5 months ago
A novel scoring schema for peptide identification by searching protein sequence databases using tandem mass spectrometry data
Background: Tandem mass spectrometry (MS/MS) is a powerful tool for protein identification. Although great efforts have been made in scoring the correlation between tandem mass sp...
Zhuo Zhang, Shiwei Sun, Xiaopeng Zhu, Suhua Chang,...
BIOSYSTEMS
2008
129views more  BIOSYSTEMS 2008»
13 years 5 months ago
Reconstruction of DNA sequences using genetic algorithms and cellular automata: Towards mutation prediction?
Change of DNA sequence that fuels evolution is, to a certain extent, a deterministic process because mutagenesis does not occur in an absolutely random manner. So far, it has not ...
Ch. Mizas, Georgios Ch. Sirakoulis, Vasilios A. Ma...