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ISCAS
2007
IEEE
93views Hardware» more  ISCAS 2007»
13 years 11 months ago
High Speed Sphere Decoding Based on Vertically Incremental Computation
— Sphere decoding enables maximum likelihood (ML) detection with lower complexity than other decoding algorithms, but it still suffers from large computational delay. This paper ...
Se-Hyeon Kang, In-Cheol Park
ICCAD
2006
IEEE
113views Hardware» more  ICCAD 2006»
14 years 2 months ago
A novel framework for faster-than-at-speed delay test considering IR-drop effects
Faster-than-at-speed test have been proposed to detect small delay defects. While these techniques increase the test frequency to reduce the positive slack of the path, they exace...
Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram
DATE
2004
IEEE
142views Hardware» more  DATE 2004»
13 years 9 months ago
Eliminating False Positives in Crosstalk Noise Analysis
Noise affects circuit operation by increasing gate delays and causing latches to capture incorrect values. Noise analysis techniques can detect some of such noise faults, but accu...
Yajun Ran, Alex Kondratyev, Yosinori Watanabe, Mal...
DATE
2008
IEEE
82views Hardware» more  DATE 2008»
13 years 11 months ago
Variation tolerant NoC design by means of self-calibrating links
We present the implementation and analysis of a variation tolerant version of a switch-to-switch link in a NoC. The goal is to tolerate the effects of process variations on NoC ar...
Simone Medardoni, Marcello Lajolo, Davide Bertozzi
VTS
2008
IEEE
136views Hardware» more  VTS 2008»
13 years 11 months ago
Test-Pattern Grading and Pattern Selection for Small-Delay Defects
Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, powersupply noise, as ...
Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Te...