5 search results - page 1 / 1 » High Temperature Experiments for Circuit Self-Recovery |
GECCO
2004
Springer
13 years 10 months ago
2004
Springer
Temperature and radiation tolerant electronics, as well as long life survivability are key capabilities required for future NASA missions. Current approaches to electronics for ext...
EH
2004
IEEE
13 years 8 months ago
2004
IEEE
Temperature and radiation tolerant electronics, as well as long life survivability are key capabilities required for future NASA missions. Current approaches to electronics for ex...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
With technology advances, the number of cores integrated on a chip and their speed of operation is increasing. This, in turn is leading to a significant increase in chip temperat...
ISQED
2008
IEEE
13 years 11 months ago
2008
IEEE
Negative bias temperature instability (NBTI) is one of the primary limiters of reliability lifetime in nano-scale integrated circuits. NBTI manifests itself in a gradual increase ...
ICCAD
2010
IEEE
13 years 2 months ago
2010
IEEE
Abstract-- Many of us in the field of ultra-low-Vdd processors experience difficulty in assessing the sub/near threshold circuit techniques proposed by earlier papers. This paper i...