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GLVLSI
2003
IEEE
180views VLSI» more  GLVLSI 2003»
13 years 11 months ago
3D direct vertical interconnect microprocessors test vehicle
The current trends in high performance integrated circuits are towards faster and more powerful circuits in the giga-hertz range and even further. As the more complex Integrated C...
John Mayega, Okan Erdogan, Paul M. Belemjian, Kuan...
TMC
2012
11 years 8 months ago
Relay-Assisted Transmission with Fairness Constraint for Cellular Networks
Abstract—We consider the problem of relay-assisted transmission for cellular networks. In the considered system, a source node together with n relay nodes are selected in a propo...
Erwu Liu, Qinqing Zhang, Kin K. Leung
ET
2002
122views more  ET 2002»
13 years 5 months ago
Using At-Speed BIST to Test LVDS Serializer/Deserializer Function
LVDS is the acronym for Low-Voltage-DifferentialSignaling and is described in both the ANSI/TIA/EIA644 and IEEE 1596.3 standards. High performance yet Low Power and EMI have made ...
Magnus Eckersand, Fredrik Franzon, Ken Filliter