7 search results - page 2 / 2 » High-Performance FPGA-Based General Reduction Methods |
DAC
2011
ACM
12 years 4 months ago
2011
ACM
In the era of deep sub-wavelength lithography for nanometer VLSI designs, manufacturability and yield issues are critical and need to be addressed during the key physical design i...
ICCAD
2009
IEEE
13 years 2 months ago
2009
IEEE
With increasing process variation, binning has become an important technique to improve the values of fabricated chips, especially in high performance microprocessors where transpa...