12 search results - page 1 / 3 » High-performance ULSI: the real limiter to interconnect scal... |
SLIP
2005
ACM
13 years 10 months ago
2005
ACM
ICCAD
2001
IEEE
14 years 1 months ago
2001
IEEE
In deep submicron VLSI circuits, interconnect reliability due to electromigration and thermal effects is fast becoming a serious design issue particularly for long signal lines. T...
CLOUDCOM
2010
Springer
13 years 2 months ago
2010
Springer
Cloud computing has seen tremendous growth, particularly for commercial web applications. The on-demand, pay-as-you-go model creates a flexible and cost-effective means to access c...
ASPDAC
2009
ACM
13 years 11 months ago
2009
ACM
— To address the performance limitation brought by the scaling issues of on-chip global wires, a new configuration for global wiring using on-chip lossy transmission lines is pr...
ICCD
2008
IEEE
14 years 1 months ago
2008
IEEE
— To address the performance limitation brought by the scaling issues of on-chip global wires, a new configuration for global wiring using on-chip lossy transmission lines(T-lin...