In recent years, remarkable market competition and economy of scale has resulted in the price erosion of wireless devices for consumer electronics. Especially for wireless data ne...
Guido R. Hiertz, Yunpeng Zang, Sebastian Max, Thom...
In the era of deep sub-wavelength lithography for nanometer VLSI designs, manufacturability and yield issues are critical and need to be addressed during the key physical design i...
In this paper, we present an experimental integrated platform for the research, development and evaluation of new VLSI back-end algorithms and design flows. Interconnect scaling ...
As transistor dimensions continue to scale deep into the nanometer regime, silicon reliability is becoming a chief concern. At the same time, transistor counts are scaling up, ena...
Andrew DeOrio, Konstantinos Aisopos, Valeria Berta...
—As the scales of parallel applications and platforms increase the negative impact of communication latencies on performance becomes large. Fortunately, modern High Performance C...