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    ITC
    1997
    IEEE
    94views Hardware» more  ITC 1997»
    Identification of Defective CMOS Devices Using Correlation and Regression Analysis of Frequency Domain Transient Signal Data
    13 years 9 months ago
    Identification of Defective CMOS Devices Using Correlation and Regression Analysis of Frequency Domain Transient Signal Data
    Download  www.cs.umbc.edu
    Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points and on IDD switching transients on the sup...
    James F. Plusquellic, Donald M. Chiarulli, Steven ...
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    VTS
    2000
    IEEE
    114views Hardware» more  VTS 2000»
    Detection of CMOS Defects under Variable Processing Conditions
    13 years 9 months ago
    Detection of CMOS Defects under Variable Processing Conditions
    Download  www.cs.umbc.edu
    Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, the power supply transient...
    Amy Germida, James F. Plusquellic
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