110 search results - page 1 / 22 » Improving Transition Delay Test Using a Hybrid Method |
DT
2006
13 years 5 months ago
2006
IOLTS
2006
IEEE
13 years 11 months ago
2006
IEEE
— Delay failures are becoming a dominant failure mechanism in nanometer technologies. Diagnosis of such failures is important to ensure yield and robustness of the design. Howeve...
VTS
2007
IEEE
13 years 11 months ago
2007
IEEE
In this paper, a novel test point insertion methodology is presented for RTL designs that aims to reduce the data volume of scan-based transition delay tests. Test points are iden...
SAFECOMP
2007
Springer
13 years 11 months ago
2007
Springer
We discuss the problem of generating test suites from UML state machines and present a method to extend the capabilities of existing automated test case generators. Current tools p...
DAC
2007
ACM
14 years 6 months ago
2007
ACM
Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...