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ICCAD
1999
IEEE
84views Hardware» more  ICCAD 1999»
13 years 9 months ago
Improving coverage analysis and test generation for large designs
State space techniques have proven to be useful for measuring and improving the coverage of test vectors that are used during functional validation via simulation. By comparing th...
Jules P. Bergmann, Mark Horowitz
TC
1998
13 years 5 months ago
Abstraction Techniques for Validation Coverage Analysis and Test Generation
ion Techniques for Validation Coverage Analysis and Test Generation Dinos Moundanos, Jacob A. Abraham, Fellow, IEEE, and Yatin V. Hoskote —The enormous state spaces which must be...
Dinos Moundanos, Jacob A. Abraham, Yatin Vasant Ho...
DAC
2004
ACM
14 years 6 months ago
Defining coverage views to improve functional coverage analysis
Coverage analysis is used to monitor the quality of the verification process. Reports provided by coverage tools help users identify areas in the design that have not been adequat...
Sigal Asaf, Eitan Marcus, Avi Ziv
TCAD
2002
106views more  TCAD 2002»
13 years 5 months ago
Design of hierarchical cellular automata for on-chip test pattern generator
This paper introduces the concept of hierarchical cellular automata (HCA). The theory of HCA is developed over the Galois extension field (2 ), where each cell of the CA can store ...
Biplab K. Sikdar, Niloy Ganguly, Parimal Pal Chaud...
IOLTS
2005
IEEE
206views Hardware» more  IOLTS 2005»
13 years 11 months ago
A Hamming Distance Based Test Pattern Generator with Improved Fault Coverage
This paper proposes a new test pattern generator (TPG) which is an enhancement of GLFSR (Galois LFSR). This design is based on certain non–binary error detecting codes, formulat...
Dhiraj K. Pradhan, Dimitri Kagaris, Rohit Gambhir