39 search results - page 1 / 8 » Improving yield and reliability of chip multiprocessors |
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
— An increasing number of hardware failures can be attributed to device reliability problems that cause partial system failure or shutdown. In this paper we propose a scheme for ...
ASPDAC
2006
ACM
13 years 10 months ago
2006
ACM
ICCAD
2009
IEEE
13 years 2 months ago
2009
IEEE
This paper accurately considers wire short defects and proposes an algorithm to guarantee IC chip yield rate improvement for redundant wire insertion. Without considering yield ra...
LCTRTS
2010
Springer
13 years 2 months ago
2010
Springer
Chip multiprocessors (CMPs) are expected to be the building blocks for future computer systems. While architecting these emerging CMPs is a challenging problem on its own, program...
GLVLSI
2009
IEEE
13 years 11 months ago
2009
IEEE
Based on the insertion of internal and external redundant wires into L-type and U-type wires, an efficient two-phase reliability-driven insertion algorithm is proposed to insert r...