6 search results - page 1 / 2 » Independent Test Sequence Compaction through Integer Program... |
ICCD
2003
IEEE
14 years 1 months ago
2003
IEEE
We discuss the compaction of independent test sequences for sequential circuits. Our first contribution is the formulation of this problem as an integer program, which we then so...
ASPDAC
1998
ACM
13 years 8 months ago
1998
ACM
— Test Pattern Generation for combinational circuits entails the identification of primary input assignments for detecting each fault in a set of target faults. An extension to ...
VLSID
2007
IEEE
14 years 5 months ago
2007
IEEE
We introduce a novel method of test generation for microprocessors at the RTL using spectral methods. Test vectors are generated for RTL faults, which are the stuck-at faults on i...
ANOR
2005
13 years 4 months ago
2005
Abstract. This is an overview of the significance and main uses of projection, lifting and extended formulation in integer and combinatorial optimization. Its first two sections de...
MICRO
2002
IEEE
13 years 4 months ago
2002
IEEE
Convergent scheduling is a general framework for instruction scheduling and cluster assignment for parallel, clustered architectures. A convergent scheduler is composed of many ind...