5 search results - page 1 / 1 » Inductance Characterization of Small Interconnects Using Tes... |
VLSID
2000
IEEE
13 years 8 months ago
2000
IEEE
The test signal method can be used to measure and model inductance parameters (self and mutual) of a very small interconnect especially in highdensity IC’s by using a test signa...
ISQED
2005
IEEE
13 years 10 months ago
2005
IEEE
This paper presents a two-step, RC-interconnect insensitive linear time-varying (LTV) driver model for gate-level timing calculation. We show how to characterize a driver with the...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
— The inductance and coupling effects in interconnects and non-linear receiver loads has resulted in complex input signals and output loads for gates in the modern deep submicron...
POPL
2006
ACM
14 years 4 months ago
2006
ACM
We describe a novel method for verifying programs that manipulate linked lists, based on two new predicates that characterize reachability of heap cells. These predicates allow re...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
—Packet-switched interconnect fabric is a promising on-chip communication solution for many-core architectures. It offers high throughput and excellent scalability for on-chip da...