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VLSID
2005
IEEE
132views VLSI» more  VLSID 2005»
14 years 5 months ago
Influence of Leakage Reduction Techniques on Delay/Leakage Uncertainty
One of the main challenges for design in the presence of process variations is to cope with the uncertainties in delay and leakage power. In this paper, the influence of leakage r...
Yuh-Fang Tsai, Narayanan Vijaykrishnan, Yuan Xie, ...
DAC
2006
ACM
14 years 5 months ago
Gain-based technology mapping for minimum runtime leakage under input vector uncertainty
The gain-based technology mapping paradigm has been successfully employed for finding minimum delay and minimum area mappings. However, existing gain-based technology mappers fail...
Ashish Kumar Singh, Murari Mani, Ruchir Puri, Mich...
DAC
2004
ACM
14 years 5 months ago
Selective gate-length biasing for cost-effective runtime leakage control
With process scaling, leakage power reduction has become one of the most important design concerns. Multi-threshold techniques have been used to reduce runtime leakage power witho...
Puneet Gupta, Andrew B. Kahng, Puneet Sharma, Denn...
ICCD
2004
IEEE
97views Hardware» more  ICCD 2004»
14 years 1 months ago
A General Post-Processing Approach to Leakage Current Reduction in SRAM-Based FPGAs
A negative effect of ever-shrinking supply and threshold voltages is the larger percentage of total power consumption that comes from leakage current. Several techniques have been...
John Lach, Jason Brandon, Kevin Skadron
DAC
2004
ACM
13 years 8 months ago
Leakage in nano-scale technologies: mechanisms, impact and design considerations
The high leakage current in nano-meter regimes is becoming a significant portion of power dissipation in CMOS circuits as threshold voltage, channel length, and gate oxide thickne...
Amit Agarwal, Chris H. Kim, Saibal Mukhopadhyay, K...