24 search results - page 4 / 5 » Influence of Leakage Reduction Techniques on Delay Leakage U... |
VLSID
2006
IEEE
14 years 6 months ago
2006
IEEE
For a nanoCMOS of sub-65nm technology, where the gate oxide (SiO2) thickness is very low, the gate leakage is one of the major components of power dissipation. In this paper, we pr...
ASPDAC
2006
ACM
13 years 12 months ago
2006
ACM
- One of the critical issues in MTCMOS design is how to estimate a circuit delay quickly. In this paper, we propose a delay modeling and static timing analysis (STA) methodology ta...
ISQED
2005
IEEE
13 years 11 months ago
2005
IEEE
Leakage power has become one of the most critical design concerns for the system-level chip designer. Multi-threshold techniques have been used to reduce runtime leakage power wit...
PATMOS
2007
Springer
14 years 3 days ago
2007
Springer
—Power consumption has emerged as the premier and most constraining aspect in modern microprocessor and application-specific designs. Gate sizing has been shown to be one of the...
TCAD
2008
13 years 5 months ago
2008
Power consumption has emerged as the premier and most constraining aspect in modern microprocessor and application-specific designs. Gate sizing has been shown to be one of the mos...