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ICCAD
1996
IEEE
121views Hardware» more  ICCAD 1996»
13 years 9 months ago
Identification of unsettable flip-flops for partial scan and faster ATPG
State justification is a time-consuming operation in test generation for sequential circuits. In this paper, we present a technique to rapidly identify state elements (flip-flops)...
Ismed Hartanto, Vamsi Boppana, W. Kent Fuchs
DAC
1997
ACM
13 years 9 months ago
ATPG for Heat Dissipation Minimization During Scan Testing
An ATPG technique is proposed that reduces heat dissipation during testing of sequential circuits that have full-scan. The objective is to permit safe and inexpensive testing of l...
Seongmoon Wang, Sandeep K. Gupta
JAIR
2010
165views more  JAIR 2010»
13 years 3 months ago
A Model-Based Active Testing Approach to Sequential Diagnosis
Model-based diagnostic reasoning often leads to a large number of diagnostic hypotheses. The set of diagnoses can be reduced by taking into account extra observations (passive mon...
Alexander Feldman, Gregory M. Provan, Arjan J. C. ...
VLSID
2002
IEEE
97views VLSI» more  VLSID 2002»
14 years 5 months ago
Multiple Faults: Modeling, Simulation and Test
We give an algorithm to model any given multiple stuck-at fault as a single stuck-at fault. The procedure requires insertion of at most ? ? ? modeling gates, when the multiplicity...
Yong Chang Kim, Vishwani D. Agrawal, Kewal K. Salu...
ICPR
2002
IEEE
14 years 6 months ago
Improved MSEL and its Medical Application
Edge detection is the basic operation in the image processing and analysis. Multiresolution Sequential Edge Linking (MSEL), which is proposed by Edward J.Delp of Purdue University...
Huiguang He, Jie Tian, Jing Wang, Hong Chen, X. P....