11 search results - page 2 / 3 » Instance Generation for SAT-based ATPG |
ETS
2010
IEEE
13 years 6 months ago
2010
IEEE
It was shown in the past that ATPG based on the Boolean Satisfiability problem is a beneficial complement to traditional ATPG techniques. Its advantages can be observed especially ...
ISCAS
2007
IEEE
13 years 11 months ago
2007
IEEE
Due to the development of high speed circuits beyond the 2-GHz mark, the significance of automatic test pattern generation for Path Delay Faults (PDFs) drastically increased in t...
DSD
2010
IEEE
13 years 3 months ago
2010
IEEE
— In this paper we propose a new method of test patterns compression based on a design of a dedicated SAT-based ATPG (Automatic Test Pattern Generator). This compression method i...
ICCAD
2002
IEEE
14 years 2 months ago
2002
IEEE
In this survey, we outline basic SAT- and ATPGprocedures as well as their applications in formal hardware verification. We attempt to give the reader a trace trough literature and...
VLSID
2010
IEEE
13 years 3 months ago
2010
IEEE
Directed test generation is important for the functional verification of complex system-on-chip designs. SAT based bounded model checking is promising for counterexample generatio...