4 search results - page 1 / 1 » LNA design for on-chip RF test |
ISCAS
2006
IEEE
13 years 10 months ago
2006
IEEE
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
RFIC reliability is fast becoming a major bottleneck in the yield and performance of modern IC systems, as process complexity and levels of integration continually increase. Due t...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
Abstract— We present a general method to evaluate RF BuiltIn Self-Test (BIST) techniques during the design stage. In particular, the adaptive kernel estimator is used to construc...
VTS
2005
IEEE
13 years 10 months ago
2005
IEEE
: This project involves the design of a CMOS RF RMS Detector that converts the RMS voltage amplitude of an RF signal to a DC voltage. Its high input impedance and small area make i...