13 search results - page 3 / 3 » LS-TDF: Low-Switching Transition Delay Fault Pattern Generat... |
VTS
2002
IEEE
13 years 10 months ago
2002
IEEE
We present a software-based weighted random pattern scheme for testing delay faults in IP cores of programmable SoCs. We describe a method for determining static and transition pr...
ASPDAC
2007
ACM
13 years 9 months ago
2007
ACM
- Two methods to apply tests to detect delay faults in standard scan designs are used. One is called launch off capture and the other is called launch off shift. Launch off shift t...
VTS
2008
IEEE
13 years 11 months ago
2008
IEEE
With increasing IC process variation and increased operating speed, it is more likely that even subtle defects will lead to the malfunctioning of a circuit. Various fault models, ...