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» Learning Acyclic Probabilistic Circuits Using Test Paths
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COLT
2008
Springer
13 years 6 months ago
Learning Acyclic Probabilistic Circuits Using Test Paths
We define a model of learning probabilistic acyclic circuits using value injection queries, in which an arbitrary subset of wires is set to fixed values, and the value on the sing...
Dana Angluin, James Aspnes, Jiang Chen, David Eise...
COLT
1995
Springer
13 years 8 months ago
On the Learnability and Usage of Acyclic Probabilistic Finite Automata
We propose and analyze a distribution learning algorithm for a subclass of Acyclic Probabilistic Finite Automata (APFA). This subclass is characterized by a certain distinguishabi...
Dana Ron, Yoram Singer, Naftali Tishby
COLT
2007
Springer
13 years 11 months ago
Learning Large-Alphabet and Analog Circuits with Value Injection Queries
Abstract. We consider the problem of learning an acyclic discrete circuit with n wires, fan-in bounded by k and alphabet size s using value injection queries. For the class of tran...
Dana Angluin, James Aspnes, Jiang Chen, Lev Reyzin
ICCAD
1997
IEEE
144views Hardware» more  ICCAD 1997»
13 years 9 months ago
Partial scan delay fault testing of asynchronous circuits
Asynchronous circuits operate correctly only under timing assumptions. Hence testing those circuits for delay faults is crucial. This paper describes a three-step method to detect...
Michael Kishinevsky, Alex Kondratyev, Luciano Lava...
VTS
1996
IEEE
76views Hardware» more  VTS 1996»
13 years 9 months ago
Test point insertion based on path tracing
This paper presents an innovative method for inserting test points in the circuit-under-test to obtain complete fault coverage for a specified set of test patterns. Rather than us...
Nur A. Touba, Edward J. McCluskey