2 search results - page 1 / 1 » Low Power Test Data Compression Based on LFSR Reseeding |
ICCD
2004
IEEE
14 years 2 months ago
2004
IEEE
Many test data compression schemes are based on LFSR reseeding. A drawback of these schemes is that the unspecified bits are filled with random values resulting in a large number ...
ICCD
2002
IEEE
14 years 2 months ago
2002
IEEE
Low power design techniques have been employed for more than two decades, however an emerging problem is satisfying the test power constraints for avoiding destructive test and im...