82 search results - page 17 / 17 » Low threshold CMOS circuits with low standby current |
DAC
2005
ACM
13 years 6 months ago
2005
ACM
With 90nm CMOS in production and 65nm testing in progress, power has been pushed to the forefront of design metrics. This paper will outline practical techniques that are used to ...
ISQED
2006
IEEE
13 years 11 months ago
2006
IEEE
As a result of aggressive technology scaling, gate leakage (gate oxide direct tunneling) has become a major component of total power dissipation. Use of dielectrics of higher perm...