—Pre-bond testing of 3-D stacked integrated circuits (ICs) involves testing each individual die before bonding. The overall yield of 3-D ICs improves with pre-bond testability be...
Xin Zhao, Dean L. Lewis, Hsien-Hsin S. Lee, Sung K...
Clock networks contribute a significant fraction of dynamic power and can be a limiting factor in high-performance CPUs and SoCs. The need for multi-objective optimization over a l...
Gating the clock is an important technique used in low power design to disable unused modules of a circuit. Gating can save power by both preventing unnecessary activiiy in the lo...
We present Low Power Illinois scan architecture (LPILS) to achieve power dissipation and test data volume reduction, simultaneously. By using the proposed scan architecture, dynam...
: Clock networks account for a significant fraction of the power dissipation of a chip and are critical to performance. This paper presents theory and algorithms for building a low...