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TCAD
2011
13 years 5 days ago
Low-Power Clock Tree Design for Pre-Bond Testing of 3-D Stacked ICs
—Pre-bond testing of 3-D stacked integrated circuits (ICs) involves testing each individual die before bonding. The overall yield of 3-D ICs improves with pre-bond testability be...
Xin Zhao, Dean L. Lewis, Hsien-Hsin S. Lee, Sung K...
ICCAD
2010
IEEE
166views Hardware» more  ICCAD 2010»
13 years 3 months ago
Low-power clock trees for CPUs
Clock networks contribute a significant fraction of dynamic power and can be a limiting factor in high-performance CPUs and SoCs. The need for multi-objective optimization over a l...
Dongjin Lee, Myung-Chul Kim, Igor L. Markov
ISLPED
1999
ACM
131views Hardware» more  ISLPED 1999»
13 years 9 months ago
Challenges in clockgating for a low power ASIC methodology
Gating the clock is an important technique used in low power design to disable unused modules of a circuit. Gating can save power by both preventing unnecessary activiiy in the lo...
David Garrett, Mircea R. Stan, Alvar Dean
DATE
2008
IEEE
106views Hardware» more  DATE 2008»
13 years 11 months ago
Low Power Illinois Scan Architecture for Simultaneous Power and Test Data Volume Reduction
We present Low Power Illinois scan architecture (LPILS) to achieve power dissipation and test data volume reduction, simultaneously. By using the proposed scan architecture, dynam...
Anshuman Chandra, Felix Ng, Rohit Kapur
TVLSI
2002
107views more  TVLSI 2002»
13 years 4 months ago
Low-power clock distribution using multiple voltages and reduced swings
: Clock networks account for a significant fraction of the power dissipation of a chip and are critical to performance. This paper presents theory and algorithms for building a low...
Jatuchai Pangjun, Sachin S. Sapatnekar