21 search results - page 4 / 5 » MARS-C: modeling and reduction of soft errors in combination... |
ASPDAC
2010
ACM
13 years 3 months ago
2010
ACM
In this paper, we present a new voltage IR drop analysis approach for large on-chip power delivery networks. The new approach is based on recently proposed sampling based reductio...
ISQED
2009
IEEE
14 years 9 hour ago
2009
IEEE
With technology scaling, the occurrence rate of not only single, but also multiple transients resulting from a single hit is increasing. In this work, we consider the effect of th...
DAC
2008
ACM
14 years 6 months ago
2008
ACM
Soft errors, once only of concern in memories, are beginning to affect logic as well. Determining the soft error rate (SER) of a combinational circuit involves three main masking ...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
This paper presents a concurrent error detection technique targeted towards control logic in a processor with emphasis on low area overhead. Rather than detect all modeled transie...
ISQED
2005
IEEE
13 years 10 months ago
2005
IEEE
As technology continues to scale beyond 100nm, there is a significant increase in performance uncertainty of CMOS logic due to process and environmental variations. Traditional c...