With technology scaling, manufacture-time and in-field permanent faults are becoming a fundamental problem. Multi-core architectures with spares can tolerate them by detecting an...
Shuou Nomura, Matthew D. Sinclair, Chen-Han Ho, Ve...
The reliability of future processors is threatened by decreasing transistor robustness. Current architectures focus on delivering high performance at low cost; lifetime device rel...
Andrea Pellegrini, Joseph L. Greathouse, Valeria B...