14 search results - page 3 / 3 » Mapping statistical process variations toward circuit perfor... |
ICCAD
2006
IEEE
14 years 1 months ago
2006
IEEE
Process variations in modern VLSI technologies are growing in both magnitude and dimensionality. To assess performance variability, complex simulation and performance models param...
ASPDAC
2008
ACM
13 years 7 months ago
2008
ACM
In the nanometer manufacturing region, process variation causes significant uncertainty for circuit performance verification. Statistical static timing analysis (SSTA) is thus dev...
GLVLSI
2006
IEEE
13 years 11 months ago
2006
IEEE
Process variations have become a key concern of circuit designers because of their significant, yet hard to predict impact on performance and signal integrity of VLSI circuits. St...
SAC
2006
ACM
13 years 11 months ago
2006
ACM
: In chip design, one of the main objectives is to decrease its clock cycle; however, the existing approaches to timing analysis under uncertainty are based on fundamentally restri...