3 search results - page 1 / 1 » Measurements and modeling of intrinsic fluctuations in MOSFE... |
ISLPED
2005
ACM
13 years 10 months ago
2005
ACM
EURODAC
1995
IEEE
13 years 8 months ago
1995
IEEE
Based on an explicit formulation of delays, an improved model for low voltage operation of CMOS inverter has been derived. Extrinsic and intrinsic effects, such as transistor curr...
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
: Empirical analyses of the IDDQ signatures of 0.18 µm devices indicate that IDDQ currents exhibit hysteresis. A newly proposed test method, SPIRIT (Single Pattern Iteration IDDQ ...