81 search results - page 2 / 17 » Methods to reduce test application time for accumulator-base... |
ATS
2001
IEEE
13 years 9 months ago
2001
IEEE
Testing and diagnosis are important issues in system-onchip (SOC) development, as more and more embedded cores are being integrated into the chips. In this paper we propose a buil...
ETS
2006
IEEE
13 years 11 months ago
2006
IEEE
A central problem in built-in self test (BIST) is how to efficiently generate a small set of test vectors that detect all targeted faults. We propose a novel solution that uses l...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
This paper presents a new application field for the Goertzel algorithm. The test of mixed-signal circuits involves the generation and analysis of signals. A standard method for th...
SAC
2002
ACM
13 years 5 months ago
2002
ACM
The cost for testing integrated circuits represents a growing percentage of the total cost for their production. The former strictly depends on the length of the test session, and...
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
Diagnosing failing vectors in a Built-In Self Test (BIST) environment is a difficult task because of the highly compressed signature coming out of the Multiple Input Shift Regist...