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ICSE
2009
IEEE-ACM
13 years 2 months ago
Model Based Functional Testing Using Pattern Directed Filmstrips
Model driven functional system testing generates test scenarios from behavioural and structural models. In order to autmatically generate tests, conditions such as invariants and ...
Tony Clark
TCAD
2008
114views more  TCAD 2008»
13 years 4 months ago
Test-Quality/Cost Optimization Using Output-Deviation-Based Reordering of Test Patterns
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
Zhanglei Wang, Krishnendu Chakrabarty
DATE
2000
IEEE
139views Hardware» more  DATE 2000»
13 years 9 months ago
A VHDL Error Simulator for Functional Test Generation
This paper describes an efficient error simulator able to analyze functional VHDL descriptions. The proposed simulation environment can be based on commercial VHDL simulators. Al...
Alessandro Fin, Franco Fummi
VLSID
2010
IEEE
155views VLSI» more  VLSID 2010»
13 years 2 months ago
Synchronized Generation of Directed Tests Using Satisfiability Solving
Directed test generation is important for the functional verification of complex system-on-chip designs. SAT based bounded model checking is promising for counterexample generatio...
Xiaoke Qin, Mingsong Chen, Prabhat Mishra
COMPSAC
2001
IEEE
13 years 8 months ago
Scenario-Based Functional Regression Testing
Regression testing has been a popular quality assurance technique. Most regression testing techniques are based on code or software design. This paper proposes a scenario-based fu...
Raymond A. Paul, Lian Yu, Wei-Tek Tsai, Xiaoying B...