— Due to continuous technology scaling, the reduction of nodal capacitances and the lowering of power supply voltages result in an ever decreasing minimal charge capable of upset...
Riaz Naseer, Younes Boulghassoul, Jeff Draper, San...
The effects of random variations during the manufacturing process on devices can be simulated as a variation of transistor parameters. Device degradation, due to temperature or vo...
Udo Sobe, Karl-Heinz Rooch, Andreas Ripp, Michael ...
el Predicate Abstraction and Refinement for Verifying RTL Verilog Himanshu Jain CMU SCS, Pittsburgh, PA 15213 Daniel Kroening ETH Z?urich, Switzerland Natasha Sharygina CMU SCS an...
Himanshu Jain, Daniel Kroening, Natasha Sharygina,...
Non-interactive zero-knowledge proofs play an essential role in many cryptographic protocols. We suggest several NIZK proof systems based on prime order groups with a bilinear map...