Sciweavers

24 search results - page 5 / 5
» Model Order Reduction of Large Circuits Using Balanced Trunc...
Sort
View
ISCAS
2007
IEEE
173views Hardware» more  ISCAS 2007»
13 years 12 months ago
Critical Charge Characterization for Soft Error Rate Modeling in 90nm SRAM
— Due to continuous technology scaling, the reduction of nodal capacitances and the lowering of power supply voltages result in an ever decreasing minimal charge capable of upset...
Riaz Naseer, Younes Boulghassoul, Jeff Draper, San...
ISQED
2008
IEEE
112views Hardware» more  ISQED 2008»
14 years 2 days ago
Robust Analog Design for Automotive Applications by Design Centering with Safe Operating Areas
The effects of random variations during the manufacturing process on devices can be simulated as a variation of transistor parameters. Device degradation, due to temperature or vo...
Udo Sobe, Karl-Heinz Rooch, Andreas Ripp, Michael ...
DAC
2005
ACM
14 years 6 months ago
Word level predicate abstraction and refinement for verifying RTL verilog
el Predicate Abstraction and Refinement for Verifying RTL Verilog Himanshu Jain CMU SCS, Pittsburgh, PA 15213 Daniel Kroening ETH Z?urich, Switzerland Natasha Sharygina CMU SCS an...
Himanshu Jain, Daniel Kroening, Natasha Sharygina,...
ASIACRYPT
2006
Springer
13 years 9 months ago
Simulation-Sound NIZK Proofs for a Practical Language and Constant Size Group Signatures
Non-interactive zero-knowledge proofs play an essential role in many cryptographic protocols. We suggest several NIZK proof systems based on prime order groups with a bilinear map...
Jens Groth