33 search results - page 1 / 7 » Model-Based Optimization of Testing through Reduction of Sti... |
IJCAI
2007
13 years 6 months ago
2007
The paper presents the theoretical foundations and an algorithm to reduce the efforts of testing physical systems. A test is formally described as a set of stimuli (inputs to the ...
ICCD
2003
IEEE
13 years 9 months ago
2003
IEEE
Excessive switching activity during shift cycles in scan-based cores imposes considerable test power challenges. To ensure rapid and reliable test of SOCs, we propose a scan chain...
ITC
2002
IEEE
13 years 9 months ago
2002
IEEE
Significant reductions in test application times can be achieved through parallelizing core tests; however, simultaneous test of various cores may result in exceeding power thres...
ICCD
2006
IEEE
14 years 1 months ago
2006
IEEE
— In this paper, we are proposing a core-based test methodology that utilizes the functional bus for test stimuli and response transportation. An efficient algorithm for the gen...
ICCAD
2000
IEEE
13 years 9 months ago
2000
IEEE
In this paper, we propose a novel fault-oriented test generation methodology for detection and isolation of faults in analog circuits. Given the description of the circuit-underte...