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DAC
2007
ACM
13 years 8 months ago
2007
ACM
ISQED
2008
IEEE
13 years 11 months ago
2008
IEEE
The effects of random variations during the manufacturing process on devices can be simulated as a variation of transistor parameters. Device degradation, due to temperature or vo...
DT
2006
13 years 4 months ago
2006
at their abstractions are similar to data types and operations supplied by conventional processors. A core principle of BCPL is its memory model: an The Challenges of Synthesizing ...
PODC
2009
ACM
14 years 2 months ago
2009
ACM
The era of parallel computing for the masses is here, but writing correct parallel programs remains far more difficult than writing sequential programs. Aside from a few domains,...
ER
2007
Springer
13 years 8 months ago
2007
Springer
The paper presents an unified Description Logic (DL) model for databases. Describing database models using DLs is a fundamental problem in many areas because it turns databases to...