9 search results - page 2 / 2 » Modeling and Analysis of Loading Effect in Leakage of Nano-S... |
CHES
2006
Springer
13 years 9 months ago
2006
Springer
In recent years, some countermeasures against Differential Power Analysis (DPA) at the logic level have been proposed. At CHES 2005 conference, Popp and Mangard proposed a new coun...
TVLSI
2010
13 years 6 days ago
2010
Abstract-- The operational characteristics of integrated circuits based on nanoscale semiconductor technology are expected to be increasingly affected by variations in the manufact...
DAC
2008
ACM
14 years 6 months ago
2008
ACM
This paper introduces an accurate and efficient electrical analysis of logic gates modeled as Multiple Voltage Threshold Models (MVTM) loaded by the associated interconnect. MVTMs...
ISLPED
2006
ACM
13 years 11 months ago
2006
ACM
Process variations will increasingly impact the operational characteristics of integrated circuits in nanoscale semiconductor technologies. Researchers have proposed various desig...