Delay evaluation is always a crucial concern in the VLSI design and it becomes increasingly more critical in the nowadays deep-submicron technology. To obtain an accurate delay va...
Muzhou Shao, Martin D. F. Wong, Huijing Cao, Youxi...
In the nanometer IC design, dummy fill is often performed to improve layout pattern uniformity and the post-CMP quality. However, filling dummies might greatly increase intercon...
As VLSI technology moves to the 65nm node and beyond, interconnect delay greatly limits the circuit performance. As a critical component in interconnect synthesis, layer assignmen...
This paper describes the early analysis and estimation features currently implemented in the Berkeley Emulation Engine (BEE) system. BEE is an integrated rapid prototyping and des...
Chen Chang, Kimmo Kuusilinna, Brian C. Richards, A...