19 search results - page 4 / 4 » Nanometer Device Scaling in Subthreshold Circuits |
CSREAESA
2004
13 years 6 months ago
2004
Interconnect delays are increasingly becoming the dominant source of performance degradation in the nano-meter regime, largely because the wires do not scale as fast as the device...
DATE
2002
IEEE
13 years 10 months ago
2002
IEEE
The relative tolerances for interconnect and device parameter variations have not scaled with feature sizes which have brought about significant performance variability. As we sca...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
- Electronic systems for safety-critical automotive applications must operate for many years in harsh environments. Reliability issues are worsening with device scaling down, while...
ISQED
2006
IEEE
13 years 11 months ago
2006
IEEE
— Negative Bias Temperature Instability (NBTI) has the potential to become one of the main show-stoppers of circuit reliability in nanometer scale devices due to its deleterious ...