4 search results - page 1 / 1 » Neural Networks-Based Parametric Testing of Analog IC |
DFT
2002
IEEE
13 years 10 months ago
2002
IEEE
DATE
2000
IEEE
13 years 9 months ago
2000
IEEE
Process variation has forever been the major fail cause of analog circuit where small deviations in component values cause large deviations in the measured output parameters. This...
BMCBI
2010
13 years 5 months ago
2010
Background: Experimental screening of large sets of peptides with respect to their MHC binding capabilities is still very demanding due to the large number of possible peptide seq...
ISCAS
2005
IEEE
13 years 10 months ago
2005
IEEE
Recent work has shown that the use of switched current methods can provide an effective route to implementation of analog IC functionality using a standard digital CMOS process. Fu...