19 search results - page 2 / 4 » New static compaction techniques of test sequences for seque... |
DATE
1998
IEEE
13 years 10 months ago
1998
IEEE
We extend the subsequence removal technique to provide signi cantly higher static compaction for sequential circuits. We show that state relaxation techniques can be used to ident...
ATS
2000
IEEE
13 years 10 months ago
2000
IEEE
We present a new test generation procedure for sequential circuits using newly traversed state and newly detected fault information obtained between successive iterations of vecto...
ICCAD
1999
IEEE
13 years 10 months ago
1999
IEEE
We describe a method referred to as sequence counting to improve on the levels of compaction achievable by vector omission based static compaction procedures. Such procedures are ...
DATE
1998
IEEE
13 years 10 months ago
1998
IEEE
A new approach for sequential circuit test generation is proposed that combines software testing based techniques at the high level with test enhancement techniques at the gate le...
ICCAD
1995
IEEE
13 years 9 months ago
1995
IEEE
: We present several techniques for accelerating dynamic vector compaction for combinational and sequential circuits. A key feature of all our techniques is that they significantly...