19 search results - page 4 / 4 » New static compaction techniques of test sequences for seque... |
DAC
1995
ACM
13 years 8 months ago
1995
ACM
Abstract A new method for power estimation in sequential circuits is presented that is based on a statistical estimation technique. By applying randomly generated input sequences t...
ATS
2009
IEEE
14 years 3 days ago
2009
IEEE
SAT-based automatic test pattern generation has several advantages compared to conventional structural procedures, yet often yields too large test sets. We present a dynamic compa...
ICCAD
2002
IEEE
14 years 2 months ago
2002
IEEE
We present a new method of built-in-self-test (BIST) for sequential circuits and system-on-a-chip (SOC) using characteristic faults and circuitspeciļ¬c spectral information in th...
ICCD
2006
IEEE
14 years 2 months ago
2006
IEEE
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...