853 search results - page 2 / 171 » New test approach for embedded applications |
DATE
2006
IEEE
13 years 11 months ago
2006
IEEE
Transparent-scan was proposed as an approach to test generation and test compaction for scan circuits. Its effectiveness was demonstrated earlier in reducing the test application ...
DATE
2003
IEEE
13 years 10 months ago
2003
IEEE
In this paper we present a microprocessor-based approach suitable for embedded flash memory testing in a System-on-achip (SOC) environment. The main novelty of the approach is the...
TIFS
2008
13 years 5 months ago
2008
A framework is proposed for synchronization in feature-based data embedding systems that is tolerant of errors in estimated features. The method combines feature-based embedding wi...
DELTA
2008
IEEE
13 years 11 months ago
2008
IEEE
—Most innovations in the automotive domain are nowadays enabled by networked embedded systems. In this context a new communication subsystem termed FlexRay was recently introduce...
SERA
2005
Springer
13 years 10 months ago
2005
Springer
In recent years, embedded systems have become so complex and the development time to market is required to be shorter than before. As embedded systems include more functions for n...