853 search results - page 3 / 171 » New test approach for embedded applications |
ATS
2010
IEEE
13 years 2 months ago
2010
IEEE
Systems with many integrated circuits (ICs), often of the same type, are increasingly common to meet the constant performance demand. However, systems in recent semiconductor techn...
DATE
2008
IEEE
2008
IEEE
State Skip LFSRs: Bridging the Gap between Test Data Compression and Test Set Embedding for IP Cores
13 years 7 months ago
1 We present a new type of Linear Feedback Shift Registers, State Skip LFSRs. State Skip LFSRs are normal LFSRs with the addition of a small linear circuit, the State Skip circuit,...
ITC
2003
IEEE
13 years 11 months ago
2003
IEEE
As semiconductor manufacturing technology advances, power dissipation and noise in scan testing has become a critical problem. In our studies on practical LSI manufacturing, we ha...
CSREAESA
2009
13 years 6 months ago
2009
A Built-In Self-Test (BIST) approach is presented for the Internal Configuration Access Port (ICAP) and Frame Error Correcting Code (ECC) logic cores embedded in Xilinx Virtex-4 an...
COMPSAC
2009
IEEE
13 years 3 months ago
2009
IEEE
1 The paper proposes a new test model, Call-For-Testing (CFT), and applies it to User Acceptance Testing (UAT) of Web Applications. Different from traditional approaches, UAT in th...