13 search results - page 1 / 3 » Noise Figure Measurement Using Mixed-Signal BIST |
ISCAS
2007
IEEE
13 years 11 months ago
2007
IEEE
—A Built-In Self-Test (BIST) approach for functionality measurements, including noise figure (NF), linearity and frequency response of analog circuitry in mixedsignal systems, is...
ETS
2006
IEEE
13 years 11 months ago
2006
IEEE
— Accurate generation of circuit specifications from test signatures is a difficult problem, since analytical expressions cannot precisely describe the nonlinear relationships ...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
A technique for evaluating noise figure suitable for BIST implementation is described. It is based on a low cost single-bit digitizer, which allows the simultaneous evaluation of ...
ICCAD
2000
IEEE
13 years 9 months ago
2000
IEEE
In this paper, we present a novel approach to use test stimuli generated by digital components of a mixed-signal circuit for testing its analog components. A wavelet transform is ...
ISCAS
2011
IEEE
12 years 8 months ago
2011
IEEE
—Linearity and spectral performance test contributes most cost of ADC test. This paper presents a new method for testing an ADC’s SNR from its linearity test data. The method d...