980 search results - page 2 / 196 » Novel Test Pattern Generators for Pseudo-Exhaustive Testing |
CORR
2011
Springer
13 years 9 days ago
2011
Springer
This paper investigates the impact of the changes of the characteristic polynomials and initial loadings, on behaviour of aliasing errors of parallel signature analyzer (Multi-Inp...
ICCAD
1994
IEEE
13 years 9 months ago
1994
IEEE
Existing built-in self test (BIST) strategies require the use of specialized test pattern generation hardware which introduces signi cant area overhead and performance degradation...
FLAIRS
2007
13 years 7 months ago
2007
In this paper we present a novel approach for patternconstrained test case generation. The generation of test cases with known characteristics is usually a non-trivial task. In co...
DAC
1997
ACM
13 years 9 months ago
1997
ACM
This paper presents a novel approach for automatic test pattern generation of asynchronous circuits. The techniques used for this purpose assume that the circuit can only be exerc...
DATE
2005
IEEE
13 years 11 months ago
2005
IEEE
— With increasing process fluctuations in nano-scale technology, testing for delay faults is becoming essential in manufacturing test to complement stuck-at-fault testing. Desig...