28 search results - page 5 / 6 » On Accelerating Soft-Error Detection by Targeted Pattern Gen... |
ATS
2009
IEEE
14 years 17 days ago
2009
IEEE
Diagnostic ATPG has traditionally been used to generate test patterns that distinguish pairs of modeled faults. In this work, we investigate the use of n-distinguishing test sets,...
WISEC
2010
ACM
14 years 22 days ago
2010
ACM
Computing environments on cellphones, especially smartphones, are becoming more open and general-purpose, thus they also become attractive targets of malware. Cellphone malware no...
ITC
2003
IEEE
13 years 11 months ago
2003
IEEE
Energy Consumption Ratio (ECR) test, a current-based test, has shown its ability to reduce the impact of process variations and detect hard-to-detect faults. The effectiveness of ...
ICASSP
2008
IEEE
14 years 6 days ago
2008
IEEE
CALL (Computer Assisted Language Learning) systems using ASR (Automatic Speech Recognition) for second language learning have received increasing interest recently. However, it st...
DATE
2007
IEEE
14 years 3 days ago
2007
IEEE
A high-level test synthesis (HLTS) method targeted for delay fault testability is presented. The proposed method, when combined with hierarchical test pattern generation for embed...