867 search results - page 4 / 174 » On Optimization of Test Parallelization with Constraints |
DATE
2007
IEEE
14 years 15 days ago
2007
IEEE
1 The increasing test data volume needed to test core-based System-on-Chip contributes to long test application times (TAT) and huge automatic test equipment (ATE) memory requireme...
ICRA
2002
IEEE
13 years 11 months ago
2002
IEEE
In this paper the workspace optimization of translational 3-UPU parallel platforms with prismatic and universal joint constraints is performed. The workspace is parameterized usin...
ASPDAC
2007
ACM
13 years 10 months ago
2007
ACM
Abstract-- This paper proposes a novel power-aware multifrequency wrapper architecture design to achieve at-speed testability. The trade-offs between power dissipation, scan time a...
DATE
2006
IEEE
14 years 6 days ago
2006
IEEE
Software-based self-test (SBST) of processors offers many benefits, such as dispense with expensive test equipments, test execution during maintenance and in the field or initiali...
HPDC
2010
IEEE
13 years 7 months ago
2010
IEEE
The statistical language R and Bioconductor package are favoured by many biostatisticians for processing microarray data. The amount of data produced by these analyses has reached...